Cutting Edge Optronics has developed a family of arrays for high-power QCW operation. These arrays are built using CTE-matched heat sinks and hard solder in order to maximize the reliability of the devices.

A summary of a recent life test is presented in order to quantify the reliability of QCW arrays and associated laser gain modules. A statistical analysis of the raw lifetime data is presented in order to quantify the data in such a way that is useful for laser system designers.

The life tests demonstrate the high level of reliability of these arrays in a number of operating regimes. For single-bar arrays, a MTTF of 19.8 billion shots is predicted. For four-bar samples, a MTTF of 14.6 billion shots is predicted. In addition, data representing a large pump source is analyzed and shown to have an expected lifetime of 13.5 billion shots. This corresponds to an expected operational lifetime of greater than ten thousand hours at repetition rates less than 370 Hz.

Cutting Edge Optronics (CEO) has recently developed high-power laser diode arrays specifically for long-life operation in quasi-CW applications. These arrays feature a new epitaxial wafer design that utilizes a large optical cavity and are packaged using AuSn solder and CTE-matched heat sinks.

This work focuses on life test matrix of multiple epitaxial structures, multiple wavelengths, and multiple drive currents.  Particular emphasis is given to the 80x and 88x wavelength bands running at 100-300 Watts per bar. Reliable operating points are identified for various applications including range finding (product lifetimes less than 1 billion shots) and industrial machining (product lifetimes greater than 20 billion shots). In addition to life test data, a summary of performance data for each epitaxial structure and each bar design is also presented.